On November 30th, the MicroElec project was launched in front of ANR members. The aim of this project is a high throughput heterostructures elaboration and characterization for microelectronic applications. In our laboratory, we will perform HAXPES & PEEM analysis of multiple FeCAPs with AI-assisted image processing using new operando sample holder & high intensity, focused X-ray source (MicroElec funded). Gunjan Yadav already worked on this topic since end of August as a postdoctoral.